Delta-L 3.0/4.0 Intelligent Control System Software

Delta-L 3.0/4.0  Intelligent Control System Software

1. In order to meet INTEL specifications, software developed and designed by citing INTEL related algorithms.

2. Supports PLTS software, which can directly test impedance and return loss.

3. Supports real-time display of S13 and S42 loss waveform overlays to promptly detect whether the probe contact is normal. It can also perform range difference foolproof control on S13 and S42 to prevent false contacts.

4. Supports switching of different test sequences for layers and line lengths, making it easier for customers to conduct better test plans for different types of PCB boards and improve work efficiency.

5. Use the WITOCG-3000 interface control card, USB port, and LAN port for use with KEYSIGHT, R&S, and CEYEAR instruments.

6. Detailed data containing uncertainty and range can meet customer requirements for new standards. Through these two projects, managers can also monitor whether the test system is stable and whether the testers' methods are consistent, etc.

7. Support customers to customize the test frequency, judgment standards, and number of layers to facilitate customers’ new product development and verification.

8. Testers only need to simply input 2 (such as 2INCH, 5INCH), or 3 (such as 2INCH, 5INCH, 10INCH) sizes of different lengths, and the software can automatically identify, combine and allocate tests, without the need to enter the corresponding ones separately. Reference samples and test samples to avoid incorrect input of sample parameters.

9. Test the insertion loss, return loss, and impedance of signal lines of different lengths in each layer of the PCB board (including CSV and S4P of each parameter)

10. Supports instrument waveform screenshots, intelligent generation of EXCEL, PDF, S4P and other report functions.

11. It can ensure data accuracy and achieve consistent WAVEFORM, screenshots and data.

12. Parameters that can be tested: DELTA, UNCERTAINTY, DIFFERENCE, IMPENDENCE, SDD11, SDD22, SDD12, SDD21.

13. It can improve testing efficiency, save testing time and reduce test personnel.